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Microwave Electronics: Measurement and Materials Characterization By L. F. Chen, C. K. Ong, C. P. Neo, V. V. Varadan, Vijay K. Varadan
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From the Back Cover
The development of high speed, high frequency circuits and systems requires an understanding of the properties of materials functioning at the microwave level. This comprehensive reference sets out to address this requirement by providing guidance on the development of suitable measurement methodologies tailored for a variety of materials and application systems. Bringing together coverage of a broad range of techniques in one publication for the first time, this book:
This book will appeal to practising engineers and technicians working in the areas of RF, microwaves, communications, solid-state devices and radar. Senior students, researchers in microwave engineering and microelectronics and material scientists will also find this book a very useful reference.
Microwave Electronics: Measurement and Materials Characterization
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Microwave Electronics: Measurement and Materials Characterization
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